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Design of CMOS circuits for stuck-open fault testability

✍ Scribed by Jayasumana, A.P.; Malaiya, Y.K.; Rajsuman, R.


Book ID
119774987
Publisher
IEEE
Year
1991
Tongue
English
Weight
406 KB
Volume
26
Category
Article
ISSN
0018-9200

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CMOS stuck-open fault testability
✍ Rajsuman, R.; Malaiya, Y.K.; Jayasumana, A.P. πŸ“‚ Article πŸ“… 1989 πŸ› IEEE 🌐 English βš– 224 KB