BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count

✍ Scribed by Hafizur Rahaman; Debesh K. Das; Bhargab B. Bhattacharya

• Publisher: Springer
• Year: 2002
• Tongue: English
• Weight: 614 KB
• Volume: 17
• Category: Article
• ISSN: 1000-9000
• DOI: 10.1007/bf02960763