SEM linewidth measurement in the process latitude investigation procedure can be replaced with a resist reflow technique for PMMA and other positive resists. The linewidth dependence on technical parameters can be measured quickly and cheaply with specialised test structures.
Design of a positive resist for projection lithography in the mid-UV
β Scribed by Grant Willson; Robert Miller; Dennis McKean; Nicholas Clecak; Terry Tompkins; Donald Hofer; Josef Michl; John Downing
- Publisher
- Society for Plastic Engineers
- Year
- 1983
- Tongue
- English
- Weight
- 663 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0032-3888
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
The design, synthesis, formulation, and process optimization of a new midβUV resist are described. The synthesis of a spectrally matched sensitizer was guided by semiempirical quantum mechanical calculations that predict the effect of structural changes on optical absorption characteristics. The formulation was guided by computer profile simulation studies and the process development by a response surface analytical procedure. These techniques allowed formulation optimization to be achieved on the basis of an understanding of the complex interactions between the resist dissolution response functions and the modulation transfer function of the exposure tool for which the resist was designed.
π SIMILAR VOLUMES
## Ab~ra~ A new software tool for the support of cell projection in combination with variable shape electron beam lithography for mask making and direct write application is described. The program has been designed and developed for the WePrint 200, a new variable shape electron beam lithography s