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Depth selection by means of scattered electrons: A method to determine electron line profiles

✍ Scribed by U. Bäverstam; C. Bohm; B. Ringström; T. Ekdahl

Publisher: Elsevier Science
Year: 1973
Weight: 438 KB
Volume: 108
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(73)90522-3

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