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Depth profiling of tritium in a thin titanium layer bombarded with deuterium ions

✍ Scribed by S. Okuda; R. Taniguchi; M. Fujishiro; Y. Satoh; E. Hiraoka

Book ID: 107809814
Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 552 KB
Volume: 128-129
Category: Article
ISSN: 0022-3115
DOI: 10.1016/0022-3115(84)90445-8

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