Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C 60+ and Ar + Co-Sputtering

✍ Scribed by Yu, Bang-Ying; Chen, Ying-Yu; Wang, Wei-Ben; Hsu, Mao-Feng; Tsai, Shu-Ping; Lin, Wei-Chun; Lin, Yu-Chin; Jou, Jwo-Huei; Chu, Chih-Wei; Shyue, Jing-Jong

• Book ID: 126262103
• Publisher: American Chemical Society
• Year: 2008
• Tongue: English
• Weight: 163 KB
• Volume: 80
• Category: Article
• ISSN: 0003-2700
• DOI: 10.1021/ac702626n