Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy

✍ Scribed by Erickson, Nicholas C.; Raman, Sankar N.; Hammond, John S.; Holmes, Russell J.

• Book ID: 127270580
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 572 KB
• Volume: 15
• Category: Article
• ISSN: 1566-1199
• DOI: 10.1016/j.orgel.2014.08.039