✦ LIBER ✦

Depth profiling of emerging materials for semiconductor devices

✍ Scribed by P.A. Ronsheim

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ultralow-energy SIMS for shallow semicon

✍ A.R. Chanbasha; A.T.S. Wee 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 299 KB

Depth profiling techniques for the eleme

✍ DE Sykes 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Molecular depth profiling of organic and

✍ John S. Fletcher; Xavier A. Conlan; Nicholas P. Lockyer; John C. Vickerman 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 204 KB

STM applications for semiconductor mater

✍ N.O. Lipari 📂 Article 📅 1987 🏛 Elsevier Science ⚖ 53 KB

Depth profiling of boron in ultra-shallo

✍ Sacit M. Çetiner; Kenan Ünlü 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 157 KB

The application of the (n, α) method for

✍ K. Müller; R. Henkelmann; F. Jahnel; H. Ryssel; K. Haberger; D. Finck; J. Biersa 📂 Article 📅 1980 🏛 Elsevier Science ⚖ 468 KB