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Depth profiling of defects in ion-implanted Ni and Fe by positron annihilation measurements

โœ Scribed by A. Kinomura; R. Suzuki; T. Ohdaira; N. Oshima; K. Ito; Y. Kobayashi


Book ID
113919465
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
363 KB
Volume
206
Category
Article
ISSN
0257-8972

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