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Depth profiling of Cu−Cr multilayer structures

✍ Scribed by J. László; D. Marton; J. Giber

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SIMS depth profiling of CrNi multilayer

✍ J Giber; D Marton; J László; A Hanusovszky; P Stingeder 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 251 KB

Improved method for depth profiling of m

✍ T.S. Horányi; P. Tüttö; G. Endrédi 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 355 KB

Effects of surface structure on depth re

✍ A. Zalar; B. Praček; P. Panjan 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 261 KB 👁 1 views

Auger electron spectroscopy composition

✍ J. Liday; R. Harman; G. Badin; J. Breza; A. Zalar 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 485 KB

Auger electron spectroscopy depth profil

✍ A. Zalar; S. Hofmann; P. Panjan 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 328 KB

Redeposition in AES sputter depth profil

✍ A. Zalar; S. Hofmann 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 380 KB