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Depth profiles of au overlayers on ag films

Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
170 KB
Volume
26
Category
Article
ISSN
0042-207X

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✦ Synopsis

Cr, Ti, Hf, Zr, Co, Ta, I'd, and Pt. The AI-Cr system was investigated in some detail using a conductance method and nuclear backscattering for reaction-rate measurements. The compounds CrAl, and Cr2AI,, were identified and their growth was found to be diffusion controlled. The temperature dependence of the rate constant for CrAl, obeyed an Arrhenius plot from 300" to 450Β°C with an activa-

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