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Depth profiling of thin films of Ag and Au on Mo deposited on a quartz crystal microbalance

✍ Scribed by J Onsgaard; E Taglauer


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
310 KB
Volume
34
Category
Article
ISSN
0042-207X

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The purpose of this work was to study surface diffusion of atoms in Au-Ag films deposited on SiO 2 substrate under the action of a d.c. field, focusing on the effect of chemical reaction at the Au-Ag/SiO 2 interface on the electromigration behaviour. Atomic force microscopy measurement depicted the