✦ LIBER ✦

Depth profile of the microhardness in helium implanted GaP

✍ Scribed by Dr. C. Ascheron; Dr. H. Neumann

Publisher: John Wiley and Sons
Year: 1987
Tongue: English
Weight: 240 KB
Volume: 22
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170221211

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of the Microhardness of

Characterization of the Microhardness of Ion-implanted GaP

✍ Doz. Dr. sc. C. Ascheron; Doz. Dr. sc. H. Neumann; Prof. Dr. sc. G. Kühn 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 446 KB 👁 1 views

## Characterization of the Microhardness of Ion-implanted GaP Dedicated to Professor E. BUTTER in honour of his 60th birthday Implantation induced changes of the microhardness are studied in GaP single crystals which were bombarded with ions in the range of mass numbers M = 1-40. It IS observed th

Variation of Chemical Parameters in the

Variation of Chemical Parameters in the Depth Profile of The River Champanala

✍ Hasan, R. 📂 Article 📅 1984 🏛 John Wiley and Sons 🌐 English ⚖ 229 KB 👁 1 views

The action of the satellite 1981 S13, an

The action of the satellite 1981 S13, and the optical depth profile of the Encke-gap ringlet in the Saturn A ring

✍ F. Spahn; A. Saar; St. Schmidt; U. Schwarz 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 371 KB

Concentration-depth calibration and bomb

Concentration-depth calibration and bombardment-induced impurity relocation in SIMS depth profiling of shallow through-oxide implantation distributions: a procedure for eliminating the matrix effect

✍ Wittmaack, K. 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 429 KB 👁 1 views

Secondary ion yields are known to be strongly enhanced by the presence of oxygen in the analysed sample. The magnitude of the yield enhancement is often signiÐcantly di †erent for impurity and matrix ion species. This kind of SIMS matrix e †ect severely aggravates concentration calibration in depth

Toward a better reliability in the decon

Toward a better reliability in the deconvolution of SIMS depth profiles

✍ Gautier, B.; Prudon, G.; Dupuy, J. C. 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 273 KB 👁 2 views

In this paper, the problem of the deconvolution of SIMS depth proÐles is addressed. In particular, the hypotheses that are necessary for the deconvolution to be possible (in the actual state of the art) in the case of the SIMS signal are reviewed. Then, the principle of regularization, which is a ma

Ellipsometric Investigations of the Refr

Ellipsometric Investigations of the Refractive Index Depth Profile in PZT Thin Films

✍ Deineka, A. ;Jastrabik, L. ;Suchaneck, G. ;Gerlach, G. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 65 KB 👁 1 views

Optical investigations of self-polarized PbZr 0.235 Ti 0.765 O 3 (PZT) films deposited onto Si/SiO 2 /adhesion layer/(111) Pt substrate by RF sputtering are presented in this work. Measurements were performed with a spectral ellipsometer working in rotating analyzer mode. To obtain the temperature d