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Depth Profile Measurement by Secondary Ion Mass Spectrometry for Determining the Tracer Diffusivity of Oxygen in Rutile

โœ Scribed by M. ARITA; M. HOSOYA; M. KOBAYASHI; M. SOMENO


Book ID
110814785
Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
564 KB
Volume
62
Category
Article
ISSN
0002-7820

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