Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)

✍ Scribed by J. Lenaerts; Geert Verlinden; Velislava A. Ignatova; L. Van Vaeck; Renaat Gijbels; Ingrid Geuens

• Book ID: 105898154
• Publisher: Springer
• Year: 2001
• Tongue: English
• Weight: 213 KB
• Volume: 370
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/s002160100880