✦ LIBER ✦

Depth profile analysis of the C/Si interface: comparison of destructive and nondestructive techniques

✍ Scribed by R. Zehringer; R. Hauert

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

AES depth profiling and interface analys

✍ A. Zalar; J. Kovač; B. Praček; S. Hofmann; P. Panjan 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 276 KB

Depth profiling of nitrogen implanted in

✍ Y Miyagawa; S Nakao; L.S Wielunski; H Hasegawa; S Miyagawa 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Determination of the interface region in

✍ T. Morohashi; T. Hoshi; H. Nikaido; M. Kudo 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 422 KB

A model calculation of the Auger depth p

✍ E.B. Bas; X.P. Pan; K.J. Rüegg; F. Stucki 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 45 KB

A model calculation of the auger depth p

✍ E.B. Bas; X.P. Pan; K.J. Rüegg; F. Stucki 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 450 KB

AES and factor analysis study of silicid

✍ Laura Steren; Ricardo Vidal; Julio Ferrón 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 485 KB