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Deposition of the IV–VI films by the hot-wall method on silicon substrates 100 mm in diameter

✍ Scribed by V. I. Rudakov; A. L. Kurenya; A. A. Shornikov; M. L. Gitlin


Book ID
110214413
Publisher
Springer
Year
2009
Tongue
English
Weight
387 KB
Volume
38
Category
Article
ISSN
1063-7397

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## Abstract We have deposited indium oxide (In~2~O~3~) films on silicon substrates by the metal organic chemical vapor deposition (MOCVD). We have investigated the effect of substrate temperature on growth and structural properties of films in the range of 200–300 °C. The films had a preferred orie