𝔖 Bobbio Scriptorium
✦   LIBER   ✦

DEPENDENCE OF THE OPTICAL AND ELECTRICAL PROPERTIES OF CHEMICALLY ANNEALED VACUUM-DEPOSITED a-Si:H FILMS ON THE DEPOSITION RATE

✍ Scribed by EL-NAGGAR, AHMED M.


Book ID
119951893
Publisher
World Scientific Publishing Company
Year
2012
Tongue
English
Weight
262 KB
Volume
27
Category
Article
ISSN
0217-9849

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Influence of thickness on the optical pr
✍ A.M. El-Naggar πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 110 KB

The in uence of the thickness of the a-Si : H ΓΏlm on its optical properties was studied using spectrophotometric measurements of the ΓΏlm transmittance and re ectance in the wavelength range 200 -3000 nm. Both the refractive index and the absorption coe cient were found to increase as the ΓΏlm thickne

Annealing effects on electrical and opti
✍ Jingchang Sun; Hongwei Liang; Jianze Zhao; Qiuju Feng; Jiming Bian; Ziwen Zhao; πŸ“‚ Article πŸ“… 2008 πŸ› Elsevier Science 🌐 English βš– 575 KB

## 2. Experimental procedures ZnO film was deposited on the SI-GaAs (100) substrate by MOCVD. Diethylzinc (DEZn) and O 2 were chosen as precursor of Zn and O, respectively, and high purity Ar was used as the carrying gas for DEZn. The mol flux ratio of Zn to O was kept at 1:250. The