Dependence of the excitonic transition energies and mosaicity on residual strain in ZnO thin films

✍ Scribed by Ong, H. C.; Zhu, A. X. E.; Du, G. T.

• Book ID: 121327639
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 281 KB
• Volume: 80
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1448660