Comparison of the crystalline quality of
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AraΓΊjo, D. ;Bustarret, E. ;Tajani, A. ;Achatz, P. ;GutiΓ©rrez, M. ;GarcΓa, A. J.
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Article
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2010
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John Wiley and Sons
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English
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## Abstract A transmission electron microscopy (TEM) study, comparing homoepitaxial diamond layers grown on different substrate surface preparation states and crystallographic orientation is presented. Quality of epilayers grown on {111} cleaved surface and on {001} polished one is evaluated in ter