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Dependence of electromigration noise on geometrical and structural characteristics in aluminum-based resistors

โœ Scribed by Chicca, S.; Ciofi, C.; Diligenti, A.; Nannini, A.; Neri, B.


Book ID
114535933
Publisher
IEEE
Year
1994
Tongue
English
Weight
323 KB
Volume
41
Category
Article
ISSN
0018-9383

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