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Dependence of deep-level parameters in ion-implanted GaAs MESFET's on material preparation

✍ Scribed by Dhar, S.; Bhattacharya, P.K.; Feng-Yuh Juang; Won-Pyo Hong; Sadler, R.A.

Book ID: 114595477
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 963 KB
Volume: 33
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1986.22446

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