Characterization of electron traps in ion-implanted GaAs MESFET's on undoped and Cr-doped LEC semi-insulating substrates

✍ Scribed by Sriram, S.; Das, M.B.

• Book ID: 114594421
• Publisher: IEEE
• Year: 1983
• Tongue: English
• Weight: 774 KB
• Volume: 30
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1983.21173