Mobility and carrier concentration profiles in ion-implanted layers on doped and undoped semi-insulating GaAs substrates at 299 and 105 K

✍ Scribed by Das, M.B.; Bonggi Kim

• Book ID: 114594014
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 720 KB
• Volume: 29
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1982.20685