Gate width effects on deep-level spectra in implanted GaAs MESFETs on LEC substrates : D. Bernal, A. Nogales, E. Calleja, E. Munoz and W. S. Lee. Solid-St. Electron.33(2), 243 (1990)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 127 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90660-f