Dependence of characteristic diode parameters on sample temperature in Ni/epitaxy n-Si contacts

✍ Scribed by K. Ejderha; A. Zengin; İ. Orak; B. Tasyurek; T. Kilinç; A. Turut

• Book ID: 103846741
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 423 KB
• Volume: 14
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2010.12.010