Features of temperature dependence of contact resistivity in ohmic contacts on lapped n-Si

✍ Scribed by Sachenko, A. V.; Belyaev, A. E.; Boltovets, N. S.; Vinogradov, A. O.; Kladko, V. P.; Konakova, R. V.; Kudryk, Ya. Ya.; Kuchuk, A. V.; Sheremet, V. N.; Vitusevich, S. A.

• Book ID: 120163071
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 517 KB
• Volume: 112
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.4752715