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Density-gradient analysis of MOS tunneling

โœ Scribed by Ancona, M.G.; Yu, Z.; Dutton, R.W.; Vande Voorde, P.J.; Cao, M.; Vook, D.


Book ID
114538467
Publisher
IEEE
Year
2000
Tongue
English
Weight
202 KB
Volume
47
Category
Article
ISSN
0018-9383

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