A comparative analysis of substrate current generation mechanisms in tunneling MOS capacitors

✍ Scribed by Palestri, P.; Serra, A.D.; Selmi, L.; Pavesi, M.; Rigolli, P.L.; Abramo, A.; Widdershoven, F.; Sangiorgi, E.

• Book ID: 114616821
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 365 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.801439