The role of substrate carrier generation in determining the electric field in the oxide of MOS capacitors biased in the Fowler-Norheim tunneling regime

✍ Scribed by Hisham Z. Massoud; James P. Shiely

• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 289 KB
• Volume: 36
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/s0167-9317(97)00060-9