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Degradation of refresh time in dynamic MOS RAM by irradiation of alpha particles

✍ Scribed by Yoshihara, T.; Takano, S.; Kimata, M.; Nakano, T.

Book ID: 114593867
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 202 KB
Volume: 28
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1981.20511

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