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Degradation of integrated schmitt triggers of the CMOS logic under the effect of ultrashort pulsed overloads

โœ Scribed by A. M. Bobreshov; A. V. Dyboi; Yu. Yu. Razuvaev; G. K. Uskov


Book ID
111444815
Publisher
Springer
Year
2010
Tongue
English
Weight
189 KB
Volume
44
Category
Article
ISSN
1063-7826

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