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Modeling the characteristics of trigger elements of two-phase CMOS logic, taking into account the charge sharing effect under exposure to single nuclear particles

✍ Scribed by Katunin, Yu. V.; Stenin, V. Ya.; Stepanov, P. V.


Book ID
125394584
Publisher
Springer
Year
2014
Tongue
English
Weight
518 KB
Volume
43
Category
Article
ISSN
1063-7397

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