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Defects of the SiC/SiO2 interface: energetics of the elementary steps of the oxidation reaction

✍ Scribed by P. Deák; A. Gali; J. Knaup; Z. Hajnal; Th. Frauenheim; P. Ordejón; J.W. Choyke

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
209 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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