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Defects in Cu[sub 2]O studied by deep level transient spectroscopy

✍ Scribed by Paul, G. K.; Nawa, Y.; Sato, H.; Sakurai, T.; Akimoto, K.


Book ID
120537871
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
278 KB
Volume
88
Category
Article
ISSN
0003-6951

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