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Defect transformation under growth of submonolayer oxides on silicon surfaces at low temperatures

✍ Scribed by Th Dittrich; T Bitzer; T Rada; N.V Richardson; V.Yu Timoshenko; J Rappich; F Koch

Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 126 KB
Volume: 59
Category: Article
ISSN: 0167-9317
DOI: 10.1016/s0167-9317(01)00675-x

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