The growth of thin Ti Ðlms on Al(001), Al(110) and Al(111) surfaces at room temperature has been studied using high-energy Rutherford backscattering spectroscopy (RBS) and channeling, x-ray photoelectron spectroscopy (XPS) and low-energy electron di †raction (LEED). Our results show that Ti atoms fo
✦ LIBER ✦
Controlled Growth of PMMA Brushes on Silicon Surfaces at Room Temperature
✍ Scribed by A. Ramakrishnan; R. Dhamodharan; Jürgen Rühe
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 243 KB
- Volume
- 23
- Category
- Article
- ISSN
- 1022-1336
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