✦ LIBER ✦

Defect tolerance in resistor-logic demultiplexers for nanoelectronics

✍ Scribed by Kuekes, Philip J; Robinett, Warren; Williams, R Stanley

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effect of Conductance Variability on Res

✍ P. Kuekes; W. Robinett; R. Williams 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 666 KB

Improved voltage margins using linear er

✍ Kuekes, Philip J; Robinett, Warren; Williams, R Stanley 📂 Article 📅 2005 🏛 Institute of Physics 🌐 English ⚖ 736 KB

Coverage Optimization for Defect-Toleran

✍ Yuan, Bo; Li, Bin 📂 Article 📅 2012 🏛 Springer 🌐 English ⚖ 433 KB

Defect-tolerant interconnect to nanoelec

✍ Kuekes, Philip J; Robinett, Warren; Seroussi, Gadiel; Williams, R Stanley 📂 Article 📅 2005 🏛 Institute of Physics 🌐 English ⚖ 316 KB

Toward hardware-redundant, fault-toleran

✍ Jie Han; Gao, J.; Jonker, P.; Yan Qi; Fortes, J.A.B. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 231 KB

Defect-tolerant n2-transistor structure

✍ El-Maleh, A.H.; Al-Hashimi, B.M.; Melouki, A.; Khan, F. 📂 Article 📅 2009 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 394 KB