Defect-tolerant n2-transistor structure for reliable nanoelectronic designs

✍ Scribed by El-Maleh, A.H.; Al-Hashimi, B.M.; Melouki, A.; Khan, F.

• Book ID: 117809867
• Publisher: The Institution of Engineering and Technology
• Year: 2009
• Tongue: English
• Weight: 394 KB
• Volume: 3
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt.2008.0133