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Defect-related Auger excitation of erbium ions in amorphous silicon

✍ Scribed by Yassievich, I N; Bresler, M S; Gusev, O B

Book ID: 125480788
Publisher: Institute of Physics
Year: 1997
Tongue: English
Weight: 154 KB
Volume: 9
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/9/43/024

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