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Defect-related Auger excitation of erbium ions in amorphous silicon

✍ Scribed by Irina Yassievich; Mikhail Bresler; Oleg Gusev

Book ID: 117149065
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 112 KB
Volume: 226
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(98)00357-3

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