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Defect reduction of selective Ge epitaxy in trenches on Si(001) substrates using aspect ratio trapping

โœ Scribed by Park, J.-S.; Bai, J.; Curtin, M.; Adekore, B.; Carroll, M.; Lochtefeld, A.


Book ID
121741637
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
445 KB
Volume
90
Category
Article
ISSN
0003-6951

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