Defect Oriented Testing for CMOS Analog and Digital Circuits

✍ Scribed by Manoj Sachdev (auth.)

Publisher: Springer US
Year: 1999
Tongue: English
Leaves: 317
Series: Frontiers in Electronic Testing 10
Category: Library

No coin nor oath required. For personal study only.

✦ Table of Contents

Front Matter....Pages i-xiv
Introduction....Pages 1-14
Digital CMOS Fault Modeling and Inductive Fault Analysis....Pages 15-63
Defects in Logic Circuits and Their Test Implications....Pages 65-94
Testing Defects in Sequential Circuits....Pages 95-132
Defect Oriented RAM Testing and Current Testable RAMs....Pages 133-204
Testing Defects in Programmable Logic Circuits....Pages 205-241
Defect Oriented Analog Testing....Pages 243-296
Conclusion....Pages 297-303
Back Matter....Pages 305-308

✦ Subjects

Electrical Engineering; Engineering Design

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