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Defect-engineering in SiC by ion implantation and electron irradiation

✍ Scribed by G. Pensl; F. Ciobanu; T. Frank; D. Kirmse; M. Krieger; S. Reshanov; F. Schmid; M. Weidner; T. Ohshima; H. Itoh; W.J. Choyke

Book ID
108207534
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
220 KB
Volume
83
Category
Article
ISSN
0167-9317

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