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Defect distribution in ion implanted silicon: comparison between Monte Carlo simulation and triple crystal X-ray measurements

✍ Scribed by M. Servidori; P. Zaumseil; U. Winter; F. Cembali; A.M. Mazzone


Book ID
113278109
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
185 KB
Volume
22
Category
Article
ISSN
0168-583X

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