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Defect detection in semiconductor layers with built-in electric field with the use of cathodoluminescence

✍ Scribed by Mariusz Pluska; Andrzej Czerwinski; Jacek Ratajczak; Anna Szerling; Jerzy Kątcki


Book ID
116833948
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
550 KB
Volume
407
Category
Article
ISSN
0921-4526

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