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Defect characterization in high temperature implanted 6HSiC using TEM

✍ Scribed by A.V. Suvorov; O.I. Lebedev; A.A. Suvorova; J. Van Landuyt; I.O. Usov


Book ID
114168822
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
272 KB
Volume
127-128
Category
Article
ISSN
0168-583X

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