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Defect Analysis on GaAs Crystals by Precision Measurements of Density and Lattice Parameter

✍ Scribed by Sajovec, F. ;Wolf, R. ;Fattah, A. ;Bickmann, K. ;Wenzl, H. ;Nagel, G. ;Rüfer, H. ;Tomzig, E. ;de Bièvre, P.

Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
779 KB
Volume
122
Category
Article
ISSN
0031-8965

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Precision lattice parameter measurements
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✍ Dr. H.-G. Brühl 📂 Article 📅 1978 🏛 John Wiley and Sons 🌐 English ⚖ 268 KB 👁 1 views

## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid