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Reduction of Planar Defect Density in Laterally Overgrown Cubic-GaN on Patterned GaAs(001) Substrates by MOVPE

✍ Scribed by S. Sanorpim; E. Takuma; R. Katayama; K. Onabe; H. Ichinose; Y. Shiraki

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 313 KB
Volume: 234
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(200212)234:3<840::aid-pssb840>3.0.co;2-k

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