✦ LIBER ✦

Deep trap levels of ion‐implanted germanium in silicon measured by Schottky contact techniques

✍ Scribed by Schulz, M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of deep trap levels in sil

✍ M. Schulz 📂 Article 📅 1974 🏛 Springer 🌐 English ⚖ 954 KB

Deep level transient spectroscopy study

✍ C. Jagadish; B.G. Svensson; N. Hauser; J.S. Williams 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 249 KB

Measurements of deep trap concentration

✍ E. N. Agafonov; A. N. Georgobiani; L. S. Lepnev 📂 Article 📅 2002 🏛 Springer 🌐 English ⚖ 66 KB